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Identification of mechanical defects in MEMS using dynamic measurements for application in production monitoring
by:
Gerbach, Ronny
Published in:
Microsystem technologies
(2010)
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Evaluation of defects in materials using resonant ultrasound spectroscopy
by:
Flynn, Kevin
Published in:
Journal of materials science
(2010)
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...misc
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lizenzpflichtig
electronic Article
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electronic Article
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Bagdahn, Joerg
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Brokmann, Geert
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Ebert, Matthias
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Flynn, Kevin
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Gerbach, Ronny
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Hein, Thomas
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Radovic, Miladin
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