Machine learning-based analyses for total ionizing dose effects in bipolar junction transistors
Published in: | Nuclear science and techniques. - Springer Nature Singapore, 2006. - 33(2022), 10 vom: Okt. |
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Main Author: | |
Other Authors: | |
Format: | electronic Article |
Language: | English |
Published: |
2022
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ISSN: | 2210-3147 |
External Sources: | lizenzpflichtig |
External Sources: lizenzpflichtig
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