Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

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Bibliographic Details

Published in:	Journal of electronic testing. - Springer US, 1990. - 38(2022), 1 vom: Feb., Seite 21-38
Main Author:	Zhao, Yujie (Author)
Other Authors:	Katoh, Kentaroh (Author) Kuwana, Anna (Author) Katayama, Shogo (Author) Wei, Jianglin (Author) Kobayashi, Haruo (Author) Nakatani, Takayuki (Author) Hatayama, Kazumi (Author) Sato, Keno (Author) Ishida, Takashi (Author) Okamoto, Toshiyuki (Author) Ichikawa, Tamotsu (Author)
Format:	electronic Article
Language:	English
Published:	2022
ISSN:	1573-0727
External Sources:	lizenzpflichtig