$Reliability of fluoride phosphor $ K_{2} $$ XF_{6} $:$ Mn^{4+} $ ($ K_{2} $$ SiF_{6} $:$ Mn^{4+} $, $ K_{2} $(Si,Ge)$ F_{6} $:$ Mn^{4+} $, $ K_{2} $$ TiF_{6} $:$ Mn^{4+} $) for LED application$

Reliability of fluoride phosphor $ K_{2} $$ XF_{6} $:$ Mn^{4+} $ ($ K_{2} $$ SiF_{6} $:$ Mn^{4+} $, $ K_{2} $(Si,Ge)$ F_{6} $:$ Mn^{4+} $, $ K_{2} $$ TiF_{6} $:$ Mn^{4+} $) for LED application

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Bibliographic Details
Published in:	Journal of materials science / Materials in electronics. - Springer US, 1990. - 29(2018), 24 vom: 26. Okt., Seite 21061-21071
Main Author:	Zheng, Fei (Author)
Other Authors:	Zou, Jun (Author) Yang, Bobo (Author) Liu, Yiming (Author) Zhou, Heyu (Author) Shi, Mingming (Author) Li, Mengtian (Author) Qian, Xinglu (Author) Liu, Zizhuan (Author) Li, Yang (Author)
Format:	electronic Article
Language:	English
Published:	2018
ISSN:	1573-482X
External Sources:	lizenzpflichtig

External Sources: lizenzpflichtig